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《科学》 第392卷 第6795期 · 2026年4月16日 · 中文解读

原子级二氧化钛介电薄膜中的铁电性

Ferroelectricity in atomic-scale titanium dioxide dielectric films · K. Das et al.
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研究表明,通过将二氧化钛薄膜厚度减薄至3纳米以下,可在这种常用介电材料中稳定铁电相,且铁电性在1纳米厚度下依然存在。
原文开头
Koushik Das1,2,3, Kate Reidy4,5, Sajid Husain3,6, Jong Ho Park2, Harishankar Jayakumar7, Vivek Thampy8, Christoph Klewe9, Ramamoorthy Ramesh3,6,10, Andrew M. Minor5,6, Archana Raja7,11, Sayeef Salahuddin2,3,6* Ferroelectricity at atomic-scale thickness would have important applications in next-generation electronics. Here, we report that a ferroelectric phase can be stabilized in titanium dioxide (TiO2) films, a commonly known dielectric that is widely used in semiconductor technologies, by reducing thickness to <3 nanometers. Importantly, this ferroelectricity persists down to 1-nanometer thickness, approximately twice the unit-cell dimension. This thickness-dependent dielectric-to-ferroelectric phase transition demonstrates that an otherwise centrosymmetric, nonferroic fluorite-structure oxide can undergo structural inversion-symmetry breaking and exhibit voltage-switchable polarization. …
摘自《科学》(Science)第392卷 第6795期 · 2026年4月16日,K. Das et al.。仅引用开头一小段供了解文章,版权归原刊所有,全文请阅读原刊。
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