Solving the ferroelectric scaling trilemma · Piush Behera, Suraj S. Cheema
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A robust oxide ferroelectric-semiconductor interface realizes an energy-efficient memory for computing Piush Behera1 and Suraj S. Cheema1,2,3 A rtificial intelligence requires enormous energy to power extensive computation, process complex algorithms, and train models on vast datasets. One promising approach to solving this demand is the ferroelectric field-effect transistor (FeFET), a memory device in which the con- ventional semiconductor gate dielectric—a thin layer separating the gate electrode from the channel that controls current—is replaced by a ferroelectric material (1, 2). FeFETs can reduce data movement by merging processing and storage, offering energy-efficient, ul- trafast computing. …
摘自《科学》(Science)第391卷 第6784期 · 2026年1月29日,Piush Behera, Suraj S. Cheema。仅引用开头一小段供了解文章,版权归原刊所有,全文请阅读原刊。